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The detection of He in tungsten following ion implantation by laser-induced breakdown spectroscopy

机译:激光诱导击穿光谱法检测离子注入后钨中的氦

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摘要

Laser-induced breakdown spectroscopy (LIBS) results are presented that provide depth-resolved identification of He implanted in polycrystalline tungsten (PC-W) targets by a 200 keV He+ ion beam, with a surface temperature of approximately 900 degrees C and a peak fluence of 10(23) m(-2). He retention, and the influence of He on deuterium and tritium recycling, permeation, and retention in PC-W plasma facing components are important questions for the divertor and plasma facing components in a fusion reactor, yet are difficult to quantify. The purpose of this work is to demonstrate the ability of LIBS to identify helium in tungsten; to investigate the sensitivity of laser parameters including, laser energy and gate delay, that directly influence the sensitivity and depth resolution of LIBS; and to perform a proof-of-principle experiment using LIBS to measure relative He intensities as a function of depth. The results presented demonstrate the potential not only to identify helium but also to develop a methodology to quantify gaseous impurity concentration in PC-W as a function of depth. (C) 2017 Elsevier B.V. All rights reserved.
机译:提出了激光诱导击穿光谱法(LIBS)的结果,该结果可通过200 keV He +离子束,表面温度约为900摄氏度和峰值注量的深度分辨鉴定植入多晶钨(PC-W)靶中的He的10(23)m(-2)。 He保留以及He对PC-W等离子组件中氘和tri循环,渗透和保留的影响是聚变反应堆中偏滤器和等离子组件的重要问题,但难以量化。这项工作的目的是证明LIBS识别钨中氦的能力。研究直接影响LIBS灵敏度和深度分辨率的激光参数(包括激光能量和门延迟)的灵敏度;并使用LIBS进行原理验证实验,以测量相对He强度随深度的变化。提出的结果证明了不仅可以识别氦气,而且可以开发一种方法来量化PC-W中气态杂质浓度随深度的变化。 (C)2017 Elsevier B.V.保留所有权利。

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