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首页> 外文期刊>IEEE Transactions on Applied Superconductivity >Thermal and Electrical Behaviors of an MI HTS Insert Comprised of THEVA-SuperPower DP Coils Under High Background Magnetic Fields at 4.2 K
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Thermal and Electrical Behaviors of an MI HTS Insert Comprised of THEVA-SuperPower DP Coils Under High Background Magnetic Fields at 4.2 K

机译:MI HTS插件的热电行为,包括在高背景磁场下的VA超级大管DP线圈,4.2 k

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摘要

In this study, two metal-as-insulation (MI) REBCO double-pancake (DP) coils comprised of THEVA and SuperPower REBCO single pancake (SP) coils were constructed and assembled. A sapphire plate was inserted in between the two-single pancake (SP) assembled as a DP, while copper plates insulated by G10 were inserted between the DPs to enhance the cooling of the MI insert. The thermal and electrical characteristics were investigated under an applied external field in the range of 0 to 19 T at 4.2 K. The insert was pushed up to the quench at each field, such defining its real operating limit without damage. Its thermal stability was checked up to 10 A/s in self-field (SF) at 4.2 K. Characteristic resistance change, current-carrying performance, quench behavior, thermal stability of the MI insert is discussed.
机译:在这项研究中,构造和组装了由THA和超级大国雷柏单煎饼(SP)线圈组成的两个金属的绝缘(MI)recco双煎饼(DP)线圈。将蓝宝石板插入组装为DP的双单煎饼(SP)之间插入,而G10绝缘的铜板被插入DPS之间,以增强Mi插入件的冷却。在0至19t的施加外部场下研究了热和电特性,在4.2k的范围内。插入件被推到每个场的淬火中,例如在没有损坏的情况下定义其实际操作限制。在4.2K时检查其热稳定性最多可在自场(SF)中的10A / s。讨论了特征性的电阻变化,电流携带性能,淬火行为,MI插入物的热稳定性。

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