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9 K operation of RSFQ logic cells fabricated by NbN integratedcircuit technology

机译:由NbN集成电路技术制造的RSFQ逻辑单元的9 K操作

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We report on the fabrication and the operation of all-NbN rapid single flux quantum (RSFQ) circuits. The NbN integrated circuit consists of NbN/AlN/NbN tunnel junctions, Mo resistors, sputtered SiO2 insulating layers, and 400-nm-thick NbN ground plane and wiring layer. The circuits were fabricated with the minimum junction size of 2 μm×2 μm and the alignment margin of +/-0.5 μm. We designed RSFQ logic cells under critical current density of 2.5 kA/cm 2, sheet resistance of 2 Ω and sheet inductance of 1.4 pH. We experimentally investigated dc bias margin of the fabricated RSFQ cells at 9 K. We observed relatively large dc bias margin of more than +/-25% for a pulse splitter, a confluence buffer and an RS flip-flop, while the dc bias margin of a T flip-flop was less than +/-5%. We succeeded to demonstrate the operation of 16-bit concurrent flow shift register at 9 K
机译:我们报告了全NbN快速单通量量子(RSFQ)电路的制造和操作。 NbN集成电路由NbN / AlN / NbN隧道结,Mo电阻器,溅射的SiO2绝缘层以及400 nm厚的NbN接地层和布线层组成。电路的最小结尺寸为2μm×2μm,对准裕度为+/- 0.5μm。我们在临界电流密度为2.5 kA / cm 2时,设计了RSFQ逻辑单元,其薄层电阻为2Ω,薄层电感为1.4 pH。我们通过实验研究了在9 K时制造的RSFQ单元的直流偏置裕度。对于脉冲分离器,汇流缓冲器和RS触发器,我们观察到相对较大的直流偏置裕度,其误差超过+/- 25%,而直流偏置裕度T型触发器的最大值小于+/- 5%。我们成功地演示了在9 K时16位并发流移位寄存器的操作

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