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首页> 外文期刊>IEEE Transactions on Applied Superconductivity >Preparation of Tl-2212 and Tl-1223 superconductor thin films and their microwave surface resistance
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Preparation of Tl-2212 and Tl-1223 superconductor thin films and their microwave surface resistance

机译:Tl-2212和Tl-1223超导体薄膜的制备及其微波表面电阻

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摘要

Epitaxial Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub y/ and Tl(Ba,Sr)/sub 2/Ca/sub 2/Cu/sub 3/O/sub y/ thin films have been prepared on CeO/sub 2/ buffered sapphire substrate by an ex situ process with high reproducibility. Microstructure analysis of the surface of the Tl-2212 films showed well connected and smaller sized grains of 1 /spl mu/m or less. In the case of Tl-1223 film, plate-like crystals with pits and pin holes could be observed. The superconducting critical temperatures of both films are around 96 K. Critical current density measured by ac susceptibility technique is as high as 1 MA/cm/sup 2/ at 77 K. The microwave surface resistance of these films was measured over a wide range of temperatures by a HTS-sapphire-HTS resonator method at 38 GHz on films with area 10 mm /spl times/ 10 mm. The temperature dependence of surface resistance of Tl-2212 film follows very closely to that of the best YBCO films on MgO substrate, whereas the Tl-1223 exhibits slightly higher values resulting from an inferior surface morphology.
机译:外延Tl / sub 2 / Ba / sub 2 / CaCu / sub 2 / O / sub y /和Tl(Ba,Sr)/ sub 2 / Ca / sub 2 / Cu / sub 3 / O / sub y /薄膜具有通过非原位方法在CeO / sub 2 /蓝宝石缓冲蓝宝石衬底上制备了具有高重现性的分子。 Tl-2212薄膜表面的微结构分析显示,连接良好,且晶粒较小,尺寸为1 / spl mu / m或更小。在Tl-1223膜的情况下,可以观察到具有凹坑和针孔的板状晶体。两种薄膜的超导临界温度都在96 K左右。通过磁化率技术测得的临界电流密度在77 K时高达1 MA / cm / sup 2 /。在很宽的温度范围内测量了这些薄膜的微波表面电阻通过HTS-sapphire-HTS共振器方法在38 GHz的温度下对面积为10 mm / spl次/ 10 mm的薄膜进行测试Tl-2212膜的表面电阻对温度的依从性非常接近MgO衬底上最好的YBCO膜,而Tl-1223则由于表面形态较差而显示出稍高的值。

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