首页> 外文期刊>IEEE Transactions on Applied Superconductivity >Superconducting properties and crystallinity of as-grown MgB/sub 2/ thin films synthesized using an in-plane-lattice near-matched epitaxial buffer layer
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Superconducting properties and crystallinity of as-grown MgB/sub 2/ thin films synthesized using an in-plane-lattice near-matched epitaxial buffer layer

机译:使用面内晶格匹配的外延缓冲层合成的MgB / sub 2 /薄膜的超导性能和结晶度

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摘要

As-grown MgB/sub 2/ thin films were synthesized at a low temperature of 270/spl deg/C on an in-plane-lattice-near-matched TiZr buffer layer grown on Al/sub 2/O/sub 3/-C substrate and Al/sub 2/O/sub 3/ substrate without buffer. The critical temperature (T/sub c/), critical current density (J/sub c/) and crystallinity of MgB/sub 2/ on TiZr buffered substrates were found to be high compared with those of MgB/sub 2/ on Al/sub 2/O/sub 3/; the improved T/sub c/ was around 35 K and J/sub c/ 6.6/spl times/10/sup 5/ A/cm/sup 2/ at 5 K under the magnetic field of 1 T perpendicular to the film surface. The epitaxial relationship of MgB/sub 2/ thin film on buffer layer was MgB/sub 2/[01-10]/spl par/TiZr[01-10]/spl par/Al/sub 2/O/sub 3/[11-20], but MgB/sub 2/ thin film without buffer layer had no epitaxial relationship.
机译:在270 / spl deg / C的低温下,在Al / sub 2 / O / sub 3 /-上生长的面内晶格几乎匹配的TiZr缓冲层上合成成膜的MgB / sub 2 /薄膜C基板和Al / sub 2 / O / sub 3 /无缓冲基板。发现在TiZr缓冲基板上的MgB / sub 2 /的临界温度(T / sub c /),临界电流密度(J / sub c /)和结晶度比在Al /上的MgB / sub 2 /高。 sub 2 / O / sub 3 /;在垂直于薄膜表面的1 T磁场下,在5 K下,改进的T / sub c /约为35 K,J / sub c / 6.6 / spl次/ 10 / sup 5 / A / cm / sup 2 /。 MgB / sub 2 /薄膜在缓冲层上的外延关系为MgB / sub 2 / [01-10] / spl par / TiZr [01-10] / spl par / Al / sub 2 / O / sub 3 / [ [图11-20],但是没有缓冲层的MgB / sub 2 /薄膜没有外延关系。

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