首页> 外文期刊>Applied Physics. A, Materials Science & Processing >Preparation and characterization of La_(0.8)Sr_(0.2)MnO_3 thin films by an excimer laser MOD process for a bolometer
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Preparation and characterization of La_(0.8)Sr_(0.2)MnO_3 thin films by an excimer laser MOD process for a bolometer

机译:辐射热计的准分子激光MOD工艺制备La_(0.8)Sr_(0.2)MnO_3薄膜并表征

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摘要

La_(0.8)Sr_(0.2)MnO_3 (LSMO) films were prepared on LaAlO_3 substrates by excimer laser metal organic deposition (ELMOD) at 500℃. The temperature dependence of resistance of the LSMO films was investigated by changing the laser flu-ence, irradiation time, and film thickness. It was found that the resistance of the LSMO films 80 nm in thickness that were irradiated by an ArF laser at a fluence of 100 mJ/cm~2 for 60 min showed a metallic temperature dependence, and the maximum temperature coefficient of resistance of the films (defined as 1/R x dR/dT) was 3.4% at 265 K.
机译:通过准分子激光金属有机沉积(ELMOD)在500℃下在LaAlO_3衬底上制备了La_(0.8)Sr_(0.2)MnO_3(LSMO)薄膜。通过改变激光通量,照射时间和膜厚来研究LSMO膜电阻的温度依赖性。发现在100 mJ / cm〜2的通量下,由ArF激光辐照60 min的厚度为80 nm的LSMO膜的电阻表现出金属温度依赖性,并且该膜的最大电阻温度系数(定义为1 / R x dR / dT)在265 K时为3.4%。

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