首页> 外文期刊>Applied Physics A: Materials Science & Processing >Multi-photon excitation fluorescence and third-harmonic generation microscopy measurements combined with confocal Raman microscopy for the analysis of layered samples of varnished oil films
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Multi-photon excitation fluorescence and third-harmonic generation microscopy measurements combined with confocal Raman microscopy for the analysis of layered samples of varnished oil films

机译:多光子激发荧光和三次谐波生成显微镜测量与共焦拉曼显微镜相结合,用于分析清漆油膜的分层样品

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The non-destructive determination of layer structures in works of art remains a significant challenge. Non-linear microscopy and confocal Raman microscopy (CRM) were employed for characterisation of varnish-media layers in model samples, providing important information regarding the thickness of materials and the identification of different media in depth. Commonly found triterpenoid varnishes mastic and dammar were applied over a single layer of films of linseed oil. Non-linear microscopy of samples was carried out using a 1028-nm femtosecond laser source; both third-harmonic generation signals (THG) and three-photon fluorescence signals (3PEF) of samples were collected in an effort to measure the thickness of mono- and bi-layers; in parallel scans of larger areas were undertaken to assess heterogeneities in samples with spatial resolution of ∼2 μm. Complementary spectroscopic information from CRM collected with both a 514.5-nm argon-ion and a 785-nm diode lasers coupled with a 100X objective and a motorised stage was carried out. Comparison of C–H stretching regions of Raman spectra allowed the differentiation between different molecular materials and the fingerprint region was employed for the depth profiling of the samples.
机译:艺术品中层结构的无损确定仍然是一个重大挑战。非线性显微镜和共焦拉曼显微镜(CRM)用于表征模型样品中的清漆-介质层,提供有关材料厚度和深度识别不同介质的重要信息。将常见的三萜类清漆乳香和达玛尔涂在亚麻籽油的单层薄膜上。使用1028 nm飞秒激光源对样品进行非线性显微镜检查;样品的三次谐波产生信号(THG)和三光子荧光信号(3PEF)均被收集,以测量单层和双层的厚度。在较大面积的平行扫描中,进行了约2μm空间分辨率的样品异质性评估。进行了来自CRM的补充光谱信息,该信息是由514.5 nm氩离子和785 nm二极管激光器以及100X物镜和电动载物台收集的。比较拉曼光谱的C–H拉伸区域,可以区分不同的分子材料,并使用指纹区域进行样品的深度分析。

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