首页> 外文期刊>Applied Physics A: Materials Science & Processing >Comment on “Exponential ionic drift: fast switching and low volatility of thin-film memristors” by D.B. Strukov and R.S. Williams in Appl. Phys. A (2009) 94: 515–519
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Comment on “Exponential ionic drift: fast switching and low volatility of thin-film memristors” by D.B. Strukov and R.S. Williams in Appl. Phys. A (2009) 94: 515–519

机译:D.B.评论“指数离子漂移:薄膜忆阻器的快速开关和低挥发性”。斯特鲁科夫和R.S.威廉姆斯在Appl。物理A(2009)94:515–519

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摘要

In a recent publication (see title), it was proposed that—instead of the average macroscopic electric field—one should use the local or LORENTZ field inside dielectrics to calculate high-field ionic drift mobilities. This incorrect proposition seems now to start circulating even though it has been clearly shown in the past that the standard equations for ionic conduction in solids are by no way subject to any corrections for local or LORENTZ field effects. It is thus worth to recall some basic assumptions with regard to ion migration in crystalline solids. We believe that the clarification of this issue is of great importance for the large and still growing community of researchers dealing with resistive switching and memristive effects.
机译:在最近的出版物(见标题)中,有人提出,应该使用电介质内部的局部场或LORENTZ场而不是平均宏观电场来计算高场离子漂移迁移率。尽管过去已经清楚地表明,固体中离子传导的标准方程式绝不会受到任何局部或LORENTZ场效应的校正,但这种错误的主张现在似乎开始流行。因此,有必要回顾一些有关结晶固体中离子迁移的基本假设。我们认为,这个问题的澄清对于处理电阻切换和忆阻效应的庞大且仍在不断增长的研究人员群体至关重要。

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