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Characterization and ammonia sensing properties of pure and modified ZnO films

机译:纯和改性ZnO薄膜的表征和氨感测特性

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Zinc oxide (ZnO) films have been prepared by thermal oxidation of pre-deposited zinc films on the glass substrate kept at room temperature. These films were surface modified by dipping them into an aqueous solution (0.1 M) of lithium chloride (LiCl) and aluminium chloride (AlCl3) followed by firing at 500°C. Based on X-ray diffraction results it is observed that modification of pure ZnO by lithium and aluminium precursor results a change in the lattice parameters. Li and Al ions appear to enhance the a-axis orientation and c-axis orientation of pure ZnO films, respectively. Field emission scanning electron micrographs of lithium-modified ZnO film indicate the presence of nanoneedles, while nanorods are observed in case of aluminium-modified ZnO film. The electrical resistance measurements of modified ZnO films also show variation in resistance as compared to pure ZnO film. Pure and Al-modified films of ZnO are sensitive to ammonia at room temperature, while Al-modified ZnO film is found to be more sensitive with 99% of response at 250 ppm.
机译:氧化锌(ZnO)膜是通过在保持室温的玻璃基板上对预先沉积的锌膜进行热氧化来制备的。通过将这些膜浸入氯化锂(LiCl)和氯化铝(AlCl 3 )的水溶液(0.1 M)中进行表面改性,然后在500°C下焙烧。根据X射线衍射结果,观察到锂和铝前体对纯ZnO的改性导致晶格参数发生变化。 Li和Al离子似乎分别增强了纯ZnO薄膜的a轴取向和c轴取向。锂修饰的ZnO膜的场发射扫描电子显微照片表明存在纳米针,而铝修饰的ZnO膜则观察到纳米棒。与纯ZnO膜相比,改性ZnO膜的电阻测量结果也显示出电阻变化。 ZnO的纯铝膜和Al修饰的膜在室温下对氨敏感,而发现Al修饰的ZnO膜在250 ppm时具有99%的响应更敏感。

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