Coherent backscattering in optical microring resonators

摘要

The effects of backscattering induced by waveguide sidewall roughness in integrated ring resonatorsnu0001RRsu0002 are experimentally observed. We demonstrate that coherent backscattering, originated bynmultiple round trips in the RR, increases with the square of the effective group index of the cavitynand can dramatically affect the behavior of integrated RRs even at moderate quality factors of 104n.nFrom our results backscattering emerges as one of the most severe limiting factors on thenperformance of RRs fabricated with state-of-the-art silicon-on-insulator nanowaveguides. © 2010