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首页> 外文期刊>Applied Physics Letters >Fatigue-free behavior of Bi3.25La0.75Ti3O12 thin films grown on several bottom eletrodes by the polymeric precursor method
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Fatigue-free behavior of Bi3.25La0.75Ti3O12 thin films grown on several bottom eletrodes by the polymeric precursor method

机译:通过聚合物前驱体方法在多个底部电极上生长的Bi3.25La0.75Ti3O12薄膜的无疲劳行为

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摘要

Fatigue-free Bi3.25La0.75Ti3O12 (BLT) thin films were grown on LaNiO3,RuO2, and La0.5Sr0.5CoO3 bottom electrodes in a microwave furnace at 700 degreesC for 10 min. The remanent polarization (P-r) and the drive voltage (V-c) were in the range of 11-23 muC/cm(2) and 0.86-1.56 V, respectively, and are better than the values found in the literature. The BLT capacitors did not show any significant fatigue up to 10(10) read/write switching cycles. (C) 2004 American Institute of Physics.
机译:使无疲劳的Bi3.25La0.75Ti3O12(BLT)薄膜在700摄氏度的微波炉中的LaNiO3,RuO2和La0.5Sr0.5CoO3底部电极上生长10分钟。剩余极化(P-r)和驱动电压(V-c)分别在11-23μC/ cm(2)和0.86-1.56 V的范围内,并且比文献中的值更好。直到10(10)个读/写开关周期,BLT电容器都没有表现出明显的疲劳。 (C)2004美国物理研究所。

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