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The structural and optical behaviors of K-doped ZnO/Al_(2)O_(3)(0001) films

机译:掺K的ZnO / Al_(2)O_(3)(0001)薄膜的结构和光学行为

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K-doped ZnO films were prepared on Al_(2)O_(3)(0001) substrates by solution deposition. For the prepared thin films of Zn_(1-x)K_(x)O (x=0.002, 0.01, 0.02, 0.05, 0.1), we carried out x-ray diffraction, transmittance spectroscopy, photoluminescence, Hall measurement and x-ray photoemission spectroscopy study, and found that properties like the crystallinity, optical band gap, carrier concentrations and chemical binding states changed at a K doping concentration of 2 mol %. From these results, we suggest that the doped K in ZnO films processed by the sol-gel method plays a different role at K doping concentrations below 2 mol % and above 2 mol %.
机译:通过溶液沉积在Al_(2)O_(3)(0001)衬底上制备了K掺杂的ZnO薄膜。对于制备的Zn_(1-x)K_(x)O(x = 0.002,0.01,0.02,0.05,0.1)薄膜,我们进行了X射线衍射,透射光谱,光致发光,霍尔测量和X射线光发射光谱研究,发现结晶度,光学带隙,载流子浓度和化学键合态等性质在2摩尔%的K掺杂浓度下发生了变化。根据这些结果,我们认为通过溶胶-凝胶法处理的ZnO薄膜中的掺杂钾在钾掺杂浓度低于2 mol%和高于2 mol%时起不同的作用。

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