Double focusing of hard x rays using combined multilayer and Bragg-Fresnel optics

摘要

A multilayer Bragg-Fresnel x-ray lens (MBFL) structure that combines diffraction and geometric focusing on a single device is presented. With the MBFL, the linear BFL focuses the x-ray beam vertically while the bent multilayer focuses x rays horizontally. This combination eliminates the need for a second mirror in the conventional Kirkpatrick-Baez-based microprobe, which will be advantageous in x-ray fluorescence microscopy as well as microdiffraction applications. The characterization of the MBFL was carried out at the European Synchrotron Radiation Facility and a 1.6 μm (vertical)×12 μm (horizontal) focus was obtained from a 250 μm (V)×200 μm (H) incident beam. With a binary Fresnel lens efficiency of about 35% this yields a gain of almost three orders of magnitude compared to obtaining the same spot size by a raw aperture.