Experimental evidence of multiple stable locations for a domain wall trapped by a submicron notch

摘要

The presence of a domain wall trapped by a submicron notch is probed in two ways: through electronic transport measurements and by magnetic force microscopy (MFM). MFM data, exhibiting complex magnetic features, are consistent with numerical simulations predicting the existence of multiple magnetic configurations stabilized at the notch. By changing the MFM scanning history we demonstrate experimentally the existence of multiple stable locations for a domain wall trapped by a submicron notch.