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Correlation of field emission and surface microstructure of vertically aligned carbon nanotubes

机译:垂直排列的碳纳米管的场发射与表面微观结构的相关性

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Two kinds of distinctive field emission behaviors were observed on vertically aligned multiwall carbon nanotube (CNT) films grown by hot filament dc-plasma enhanced chemical vapor deposition. Some samples have stable emission current for more than 60 h (type I), while others degrade substantially in the first 16 h (type II). During the field emission measurement, a brief exposure to air led an abrupt decrease of emission current of all samples. But subsequent reevacuation made type I samples recover the emission current fully, whereas type II samples were damaged permanently reflecting on the irrecoverable emission current. Microstructure studies by transmission electron microscope clearly showed that the stable emission is due to a surface passivation of CNTs by a thin layer of amorphous carbon that prevents CNTs from reacting with ambient gases, e.g., oxygen, during air exposure.
机译:在通过热丝直流等离子体增强化学气相沉积法生长的垂直排列多壁碳纳米管(CNT)薄膜上观察到两种独特的场发射行为。一些样品在超过60小时(I型)中具有稳定的发射电流,而另一些样品在开始的16小时(II型)中会大幅降低。在现场发射测量期间,短暂暴露在空气中会导致所有样品的发射电流突然降低。但是随后的重新疏散使I型样品完全恢复了发射电流,而II型样品由于不可恢复的发射电流而被永久性损坏。通过透射电子显微镜进行的微结构研究清楚地表明,稳定的发射归因于无定形碳薄层对CNT的表面钝化,从而防止了CNT在暴露于空气中时与周围的气体(例如氧气)反应。

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