Temperature mapping and thermal lensing in large-mode, high-power laser diodes

摘要

The authors use high-resolution charge-coupled device based thermoreflectance to derive two dimensional facet temperature maps of a λ = 1.55 μm InGaAsP/InP watt-class laser that has a large ( > 5 X 5 μm~2) fundamental optical mode. Recognizing that temperature rise in the laser will lead to refractive index increase, they use the measured temperature profiles as an input to a finite-element mode solver, predicting bias-dependent spatial mode behavior that agrees well with experimental observations. These results demonstrate the general usefulness of high-resolution thermal imaging for studying spatial mode dynamics in photonic devices.