Online measurement of the optical anisotropy during the growth of crystalline organic films

摘要

We report a reflectance difference spectroscopy (RDS) investigation of the growth of para-sexiphenyl (p-6P) on a TiO_2(110) single crystal substrate at 100, 300, and 400 K. The results demonstrate that RDS is a powerful technique to monitor organic thin film growth from the submonolayer regime to device relevant thicknesses. Based on the polarization dependence of the optical absorption at characteristic wavelengths, the orientation and the crystalline properties of the organic molecules can be directly determined from the RD spectrum with an extremely high sensitivity.