Epitaxial growth and dielectric properties of Pb_(0.4)Sr_(0.6)TiO_3 thin films on (00l)-oriented metallic Li_(0.3)Ni_(0.7)O_2 coated MgO substrates

摘要

Highly (00l)-oriented Li_(0.3)Ni_(0.7)O_2 thin films have been fabricated on (001) MgO substrates by pulsed laser deposition. The Pb_(0.4)Sr_(0.6)TiO_3 (PST40) thin film deposited subsequently also shows a significant (00l)-oriented texture. Both the PST40 and Li_(0.3)Ni_(0.7)O_2 have good epitaxial behavior. The epitaxial growth of the PST40 thin film is more perfect with the Li_(0.3)Ni_(0.7)O_2 buffer layer due to the less distortion in the film. The dielectric tunability of the PST40 thin film with Li_(0.3)Ni_(0.7)O_2 buffer layer therefore reaches 70%, which is 75% higher than that without Li_(0.3)Ni_(0.7)O_2 buffer layer, and the dielectric loss of the PST40 thin film is 0.06.