首页> 外文期刊>Applied Physics Letters >Electrically pumped ultraviolet random lasing from heterostructures formed by bilayered MgZnO films on silicon
【24h】

Electrically pumped ultraviolet random lasing from heterostructures formed by bilayered MgZnO films on silicon

机译:从硅上的双层MgZnO薄膜形成的异质结构中电泵浦紫外线随机激射

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

We report on electrically pumped ultraviolet random lasing (RL) from heterostructures formed by bilayered MgZnO films on silicon, where Mg_(0.15)Zn_(0.85)O and Mg_xZn_(1-x)O (x=0.25 or above) films act as the light-emitting and barrier layers, respectively. While, with a barrier layer composed of a Mg_(0.20)Zn_(0.80)O film, only spontaneous electroluminescence occurs in the heterostructures. It has thus been proved that a large enough conduction-band offset (△E_c) is necessary for the electrically pumped RL from the MgZnO film-based heterostructures. The △E_c required herein is estimated to be ~0.17 eV. The mechanism for the results as mentioned above has been tentatively elucidated.
机译:我们报道了由硅上的双层MgZnO薄膜形成的异质结构电泵浦紫外线随机激射(RL),其中Mg_(0.15)Zn_(0.85)O和Mg_xZn_(1-x)O(x = 0.25或更高)薄膜充当分别为发光层和阻挡层。然而,在由Mg_(0.20)Zn_(0.80)O膜构成的阻挡层的情况下,异质结构中仅发生自发的电致发光。因此已经证明,对于来自基于MgZnO膜的异质结构的电泵浦RL而言,足够大的导带偏移(△E_c)是必要的。本文所需的△E_c估计为〜0.17 eV。初步阐明了上述结果的机制。

著录项

  • 来源
    《Applied Physics Letters》 |2010年第6期|P.061111.1-061111.3|共3页
  • 作者单位

    Department of Materials Science and Engineering, State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, China;

    rnDepartment of Materials Science and Engineering, State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, China;

    rnDepartment of Materials Science and Engineering, State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, China;

    rnDepartment of Materials Science and Engineering, State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号