Probing buried organic-organic and metal-organic heterointerfaces by hard x-ray photoelectron spectroscopy

摘要

We present a nondestructive characterization method for buried hetero-interfaces for organic/ organic and metal/organic systems using hard x-ray photoelectron spectroscopy (HAXPES) which can probe electronic states at depths deeper than ～10nm. A significant interface-derived signal showing a strong chemical interaction is observed for Au deposited onto a C_(60) film, while there is no such additional feature for copper phthalocyanine deposited onto a C_(60) film reflecting the weak interaction between the molecules in the latter case. A depth analysis with HAXPES reveals that a Au-C_(60) intermixed layer with a thickness of 5.1 nm is formed at the interface.