Analyzing nanotextured transparent conductive oxides for efficient light trapping in silicon thin film solar cells

摘要

Nanotextured contact layers are used in silicon thin film solar cells for increasing the short circuit current and conversion efficiency. We developed an approach to analyze random nanotextured surfaces by atomic force microscopy and image segmentation. It was used to investigate sputtered and wet chemically etched aluminum doped zinc oxide films with various morphologies. The information extracted from the surfaces was correlated with optical simulations of periodically textured thin film solar cells. The results from the surface analysis and optical simulations were also compared with the experimental results obtained for amorphous silicon solar cells prepared on the nanotextured substrates.