机译:RRAM中用于重置统计信息的基于单元的集群模型
Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China;
Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China ,University of Chinese Academy of Sciences, Beijing 100049, China ,Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing 210023, China;
Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China;
Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China ,University of Chinese Academy of Sciences, Beijing 100049, China ,Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing 210023, China;
Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China ,University of Chinese Academy of Sciences, Beijing 100049, China ,Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing 210023, China;
Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China ,University of Chinese Academy of Sciences, Beijing 100049, China ,Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing 210023, China;
Departament d'Enginyeria Electrònica, Universitat Autònoma de Barcelona, Bellaterra 08193, Spain;
Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China ,University of Chinese Academy of Sciences, Beijing 100049, China ,Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing 210023, China;
机译:缺陷聚类模型在RRAM器件中的形成,SET和RESET统计中的应用
机译:基于
机译:统计方法研究双极型Cu / HfO _2 / Pt RRAM器件的RESET开关机制
机译:紧凑的RRAM的SET和RESET开关统计分析模型,受到基于单元的栅介质击穿渗流模型的启发
机译:二氧化碳的统计建模和时间相关信息的聚类分析:滞后目标时间序列聚类,多因素时间序列聚类和多级时间序列聚类
机译:纯时间疾病聚类的多聚类检测测试:扫描统计量和广义线性模型的集成
机译:城市区域空气质量建模:一种基于细胞的统计方法†
机译:用统计模型评估和监测多建筑群中的节能。