Random stick network analysis of electronic transport in carbon nanotube thin films

摘要

Electronic transport in metallic carbon nanotube (CNT) thin films is investigated theoretically using a random stick network analysis combined with circuit theory. To discuss the dependence of the sheet conductance on the CNT alignment in the films, an angle phi(max) (0 degrees = phi(max) = 90 degrees) is introduced as a new parameter to characterize the CNTalignment: phi(max) = 0 degrees and phi(max) = 90 degrees correspond to perfectly aligned and perfectly random network structures, respectively. The results indicate that the conductance exhibits a maximum around phi(max) = 55 degrees. In addition, the conductance shows a local minimum around phi(max) = 30 degrees because CNTs tend to intersect with incommensurate junctions that have a high contact resistance. (c) 2019 The Japan Society of Applied Physics