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Absolute Measurement of Baselines up to 403 m Using Heterodyne Temporal Coherence Interferometer with Optical Frequency Comb

机译:使用带有光学频率梳的外差时间相干干涉仪对高达403 m的基线进行绝对测量

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摘要

A heterodyne interference system is developed for baseline measurement by using an acoustic optical modulator and an optical frequency comb stabilized by a rubidium atomic clock. Temporal coherence interference occurs at discrete spatial positions, when two pulse trains overlap. An optical delay of the interferometer with a piezoelectric transducer is created to determine the peak positions of the interference fringe patterns, and the absolute distance is obtained at a high resolution of several tens of nanometers. The experimental results at baseline distances up to 403.2 m show a high reproducibility of about 6 μm.
机译:通过使用声学光学调制器和由by原子钟稳定的光学频率梳,开发了用于基准测量的外差干涉系统。当两个脉冲序列重叠时,时间相干干扰发生在离散的空间位置。产生具有压电换能器的干涉仪的光学延迟,以确定干涉条纹图案的峰值位置,并且以几十纳米的高分辨率获得绝对距离。在最高达403.2 m的基线距离处的实验结果显示出约6μm的高重现性。

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  • 来源
    《Applied physics express》 |2012年第4期|p.046601.1-046601.3|共3页
  • 作者单位

    Department of Precision Engineering, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan;

    Department of Precision Engineering, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan;

    Department of Precision Engineering, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan;

    High Energy Accelerator Research Organization (KEK), Tsukuba, Ibaraki 305-0801, Japan;

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