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Using a new VSI EWMA average loss control chart to monitor changes in the difference between the process mean and target and/or the process variability

机译:使用新的VSI EWMA平均损失控制图来监视过程均值和目标之间的差异和/或过程变异性的变化

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摘要

A single chart, instead of X and R charts or X and S charts, to simultaneously monitor the process mean and variability would reduce the required time and effort. A number of studies have attempted to find such charts. Moreover, a number of studies demonstrated that the adaptive control charts may detect process shifts faster than the fixed control charts. This paper proposes an easier EWMA average loss chart with variable sampling intervals to effectively monitor the process and diagnose whether the out-of-control process is caused by the changes in the difference of process mean and target or the increase in process variability, or both. Furthermore, an optimal variable sampling interval EWMA average loss chart is also proposed. An example is used to illustrate the application and evaluate the performance of the proposed control chart in detecting and diagnosing the increases in the difference of the process mean and target and/or the process variability. Numerical analyses demonstrated that the optimal VSI EWMA average loss chart outperforms the average loss chart with fixed design parameters and the Shewhart joint X and S charts. Therefore, the (optimal) VSI EWMA average loss chart is recommended.
机译:一个单一的图表(而不是X和R图表或X和S图表)同时监视过程均值和可变性将减少所需的时间和精力。许多研究试图找到这样的图表。此外,许多研究表明,自适应控制图可能比固定控制图更快地检测过程偏移。本文提出了一种具有可变采样间隔的更简单的EWMA平均损失图,以有效地监视过程并诊断失控过程是由过程均值和目标差的变化或过程变异性的增加所引起,还是两者兼而有之。此外,还提出了最佳可变采样间隔EWMA平均损失图。通过一个示例来说明应用程序并评估所提出的控制图在检测和诊断过程平均值和目标差异和/或过程变异性方面的增加时的性能。数值分析表明,最佳VSI EWMA平均损耗图优于固定设计参数的平均损耗图以及Shewhart联合X和S图。因此,建议使用(最佳)VSI EWMA平均损耗图。

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