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Essential and Non-essential Work of Fracture of PI/SiO2 Hybrid Thin Films

机译:PI / SiO2 杂化薄膜断裂的必要和非必要工作

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Essential work of fracture (EWF) analysis is used to study the effect of the silica doping level on fracture toughness of polyimide/silica (PI/SiO2) hybrid films. By using double-edge-notched-tension (DENT) specimens with different ligament lengths, it seems that the introduction of silica additive can improve the specific essential work of fracture (w e ) of PI thin films, but the specific non-essential work of fracture (βw p ) will decease significantly as the silica doping level increasing from 1 to 5 wt.%, and even lower than that of neat PI. The failure process of the fracture is investigated with online scanning electron microscope (SEM) observation and the parameters of non-essential work of fracture, β and w p , are calculated based on finite element (FE) method.
机译:断裂(EWF)分析的基本工作用于研究二氧化硅掺杂水平对聚酰亚胺/二氧化硅(PI / SiO2 )混合薄膜的断裂韧性的影响。通过使用具有不同韧带长度的双边缘缺口拉伸(DENT)标本,似乎引入二氧化硅添加剂可以改善PI薄膜的特定断裂必不可少的功(we ),但是特定的非二氧化硅的掺杂量从1 wt%增加到5 wt。%(甚至低于纯净PI)时,断裂的基本功(βwp )将显着降低。用在线扫描电子显微镜(SEM)观察断裂的失效过程,并基于有限元(FE)法计算出断裂的非必要功参数β和w p

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