A technique for improving gain and noise performance of differential wideband common-gate low noise amplifiers is presented. It is based on current bleeding and noise cancellation. An amplifier employing the technique has been designed and simulated in a 90 nm standard CMOS process using a 1 V supply. It has been compared to designs using both basic and cross-coupled common-gate topologies. Simulation results confirm the improvements in gain and noise figure, yielding a superior figure of merit for the new technique.
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