Rransient growth bands in silicon nitride cooled in rare-earth-based glass

摘要

Silicon nitride (Si_3N_4) particles embedded in various R-Si- Al-O-N glasses (R=la, Nd, Gd, Yb) have been systemati- Cally studied by high-resolution transmission electron Microscopy and by analytical electron microscopy. The par- Ticles typically show an internal growth band, which is Attributed to the enhanced growth of the particles in the Supersaturated silicate liquid during cooling and reheat- Ing.