Key metrological issues in proficiency testing––response to “Metrological compatibility-a key issue in further accreditation” by K. Heydorn

摘要

A discussion of proficiency testing (PT) topics started by Heydorn (Accred Qual Assur 15:643–645, 2010) is continued in the present paper. The role of PT in the accreditation of testing/analytical laboratories, the use of consensus values (average or weighted average, median, observed standard deviation, etc.) and a metrological background of PT schemes are discussed. It is shown that metrological traceability, comparability, and compatibility, as well as commutability of a reference material, are the key issues of any PT scheme that applies certified reference material as test items. Metrological compatibility of PT results in such schemes is a property demonstrating the closeness of the PT results to the certified value in comparison with the measurement uncertainty of their difference. The metrological background is especially important for the selection and use of PT schemes for a limited number of participants (fewer than 30) as detailed in IUPAC/CITAC Guide on the topic published in 2010 in Pure Appl Chem 82(5):1099–1135.