Photoelectrical Properties Investigated on Individual Si Nanowires and Their Size Dependence

摘要

a–c SEM images of main procedures to fabricate vertically aligned Si NWs array: a Self-assembled PS monolayer, b diameter-reduced PS monolayer and c fabricated Si NWs array. d EDX spectrum measured on Si NWs. e Schematic diagrams of PCAFM and EFM under laser irradiation