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Optical Dielectric Loss as a Novel Approach to Specify the Types of Electron Transition: XRD and UV-vis as a Non-Destructive Techniques for Structural and Optical Characterization of PEO Based Nanocomposites

机译:光学介电损耗作为指定电子转型类型的新方法:XRD和UV-VIS作为基于PEO基纳米复合材料的结构和光学表征的非破坏性技术

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摘要

The structure and optical properties of polyethylene oxide (PEO) doped with tin titanate (SnTiO ) nano-filler were studied by X-ray diffraction (XRD) and UV-Vis spectroscopy as non-destructive techniques. PEO-based composed polymer electrolytes inserted with SnTiO nano-particles (NPs) were synthesized through the solution cast technique. The change from crystalline phase to amorphous phase of the host polymer was established by the lowering of the intensity and broadening of the crystalline peaks. The optical constants of PEO/SnTiO nano-composite (NC), such as, refractive index ( ), optical absorption coefficient ( ), dielectric loss ( ), as well as dielectric constant (ε ) were determined for pure PEO and PEO/SnTiO NC. From these findings, the value of of PEO altered from 2.13 to 2.47 upon the addition of 4 wt.% SnTiO NPs. The value of ε also increased from 4.5 to 6.3, with addition of 4 wt.% SnTiO . The fundamental optical absorption edge of the PEO shifted toward lower photon energy upon the addition of the SnTiO NPs, confirming a decrement in the optical band gap energy of PEO. The band gap shifted from 4.78 eV to 4.612 eV for PEO-doped with 4 wt.% SnTiO . The nature of electronic transitions in the pure and the composite material were studied on the basis of Tauc’s model, while optical examination was also carried out to calculate the optical band gap.
机译:用X射线衍射(XRD)和UV-Vis光谱研究掺杂有钛酸锡(SNTIO)纳米填料的聚环氧乙烷(PEO)的结构和光学性质作为非破坏性技术。通过溶液浇铸技术合成了与SnTiO纳米颗粒(NPS)插入的基于PEO的组合聚合物电解质。通过降低结晶峰的强度和扩展来确定从结晶相与宿主聚合物的无定形相的变化。 PEO / SNTIO纳米复合物(NC)的光学常数,例如折射率(),光学吸收系数(),介电损耗()以及纯PEO和PEO / SNTIO确定介电损耗(ε) NC。从这些发现中,在加入4重量%的情况下,PEO的值从2.13改变为2.13。%sntio nps。 ε的值也从4.5增加到6.3,加入4重量%。%sntio。 PEO的基本光学吸收边缘在加入SNTIO NPS时朝向更低的光子能量移动,确认PEO的光带间隙能量下降。带隙从4.78eV转移到4.612 eV,用于掺杂4重量%。%sntio。在Tauc的模型的基础上研究了纯净和复合材料中的电子转变的性质,而光学检查也进行了计算光学带隙。

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