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Destructive Clustering of Metal Nanoparticles in Chalcogenide and Oxide Glassy Matrices

机译:硫属化物和氧化物玻璃态基质中金属纳米粒子的破坏性聚集

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摘要

The energetic χ-criterion is developed to parameterize difference in the origin of high-order optical non-linearity associated with metallic atoms (Cu, Ag, Au) embedded destructively in oxide- and chalcogenide glasses. Within this approach, it is unambiguously proved that covalent-bonded networks of soft semiconductor chalcogenides exemplified by binary As(Ge)–S(Se) glasses differ essentially from those typical for hard dielectric oxides like vitreous silica by impossibility to accommodate pure agglomerates of metallic nanoparticles. In an excellence according to known experimental data, it is suggested that destructive clustering of nanoparticles is possible in Cu-, Ag-, and Au-ion-implanted dielectric oxide glass media, possessing a strongly negative χ-criterion. Some recent speculations trying to ascribe equally this ability to soft chalcogenide glasses despite an obvious difference in the corresponding bond dissociation energies have been disclosed and criticized as inconclusive.
机译:开发高能χ准则以参数化与破坏性地嵌入氧化物和硫族化物玻璃中的金属原子(Cu,Ag,Au)相关的高阶光学非线性起源的差异。通过这种方法,可以明确地证明,以二元As(Ge)-S(Se)玻璃为例的软半导体硫族化物的共价键网络与玻璃质二氧化硅等硬质介电氧化物的典型区别在于,它不可能容纳金属的纯附聚物纳米粒子。根据已知实验数据的一项出色表现,表明在具有强烈负χ准则的Cu,Ag和Au离子注入介电氧化物玻璃介质中,纳米粒子可能发生破坏性聚集。尽管相应的键解离能有明显的差异,但一些最近的猜测试图将这种软化硫属元素化物玻璃的能力均等地归因于人们,并没有定论。

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