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Calibration of force detection for arbitrarily shaped particles in optical tweezers

机译:光学镊子中任意形状颗粒的力检测校准

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摘要

Force measurement with an optical trap requires calibration of it. With a suitable detector, such as a position-sensitive detector (PSD), it is possible to calibrate the detector so that the force can be measured for arbitrary particles and arbitrary beams without further calibration; such a calibration can be called an “absolute calibration”. Here, we present a simple method for the absolute calibration of a PSD. Very often, paired position and force measurements are required, and even if synchronous measurements are possible with the position and force detectors used, knowledge of the force–position curve for the particle in the trap can be highly beneficial. Therefore, we experimentally demonstrate methods for determining the force–position curve with and without synchronous force and position measurements, beyond the Hookean (linear) region of the trap. Unlike the absolute calibration of the force and position detectors, the force–position curve depends on the particle and the trapping beam, and needs to be determined in each individual case. We demonstrate the robustness of our absolute calibration by measuring optical forces on microspheres as commonly trapped in optical tweezers, and other particles such a birefringent vaterite microspheres, red blood cells, and a deformable “blob”.
机译:用光阱测量力需要对其进行校准。使用合适的检测器,例如位置敏感检测器(PSD),可以对检测器进行校准,从而无需进一步校准即可测量任意粒子和任意光束的力;这样的校准可以称为“绝对校准”。在这里,我们提出了一种用于PSD绝对校准的简单方法。通常,需要成对的位置和力测量,即使使用所使用的位置和力检测器可以进行同步测量,了解陷阱中颗粒的力-位置曲线也可能会非常有益。因此,我们通过实验演示了在陷阱的Hookean(线性)区域之外使用和不使用同步力和位置测量来确定力-位置曲线的方法。与力和位置检测器的绝对校准不同,力-位置曲线取决于粒子和捕获束,需要在每种情况下确定。我们通过测量通常夹在光学镊子中的微球和其他颗粒(如双折射球ate石微球,红血球和可变形的“斑点”)上的光学力来证明我们绝对校准的鲁棒性。

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