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Room temperature electrical spin injection into GaAs by an oxide spin injector

机译:通过氧化物自旋注入器将室温电自旋注入GaAs

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摘要

Spin injection, manipulation and detection are the integral parts of spintronics devices and have attracted tremendous attention in the last decade. It is necessary to judiciously choose the right combination of materials to have compatibility with the existing semiconductor technology. Conventional metallic magnets were the first choice for injecting spins into semiconductors in the past. So far there is no success in using a magnetic oxide material for spin injection, which is very important for the development of oxide based spintronics devices. Here we demonstrate the electrical spin injection from an oxide magnetic material Fe3O4, into GaAs with the help of tunnel barrier MgO at room temperature using 3-terminal Hanle measurement technique. A spin relaxation time τ ~ 0.9 ns for n-GaAs at 300 K is observed along with expected temperature dependence of τ. Spin injection using Fe3O4/MgO system is further established by injecting spins into p-GaAs and a τ of ~0.32 ns is obtained at 300 K. Enhancement of spin injection efficiency is seen with barrier thickness. In the field of spin injection and detection, our work using an oxide magnetic material establishes a good platform for the development of room temperature oxide based spintronics devices.
机译:自旋注入,操纵和检测是自旋电子设备不可或缺的部分,并且在过去十年中引起了极大的关注。必须明智地选择正确的材料组合,以与现有的半导体技术兼容。过去,传统的金属磁体是将自旋注入半导体的首选。迄今为止,将磁性氧化物材料用于自旋注入没有成功,这对于基于氧化物的自旋电子器件的开发非常重要。在这里,我们演示了使用三端Hanle测量技术在室温下借助隧道势垒MgO从氧化物磁性材料Fe3O4到GaAs的电自旋注入。观察到在300 nK时n-GaAs的自旋弛豫时间τ〜0.9 ns,以及预期的温度依赖性τ。通过将自旋注入p-GaAs中,进一步建立了使用Fe3O4 / MgO系统的自旋注入,在300 K下获得了约0.32 ns的τ,随着势垒厚度的增加,可以看到自旋注入效率的提高。在自旋注入和检测领域,我们使用氧化物磁性材料的工作为开发基于室温氧化物的自旋电子器件奠定了良好的平台。

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