An accurate description of the interaction of intense hard X-ray pulses with heavy atoms, which is crucial for many applications of free-electron lasers, represents a hitherto unresolved challenge for theory because of the enormous number of electronic configurations and relativistic effects, which need to be taken into account. Here we report results on multiple ionization of xenon atoms by ultra-intense (about 1019 W/cm2) femtosecond X-ray pulses at photon energies from 5.5 to 8.3 keV and present a theoretical model capable of reproducing the experimental data in the entire energy range. Our analysis shows that the interplay of resonant and relativistic effects results in strongly structured charge state distributions, which reflect resonant positions of relativistically shifted electronic levels of highly charged ions created during the X-ray pulse. The theoretical approach described here provides a basis for accurate modeling of radiation damage in hard X-ray imaging experiments on targets with high-Z constituents.
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机译:精确描述强硬X射线脉冲与重原子之间的相互作用,这对于自由电子激光器的许多应用至关重要,但由于电子结构和相对论效应的数量众多,这是迄今为止迄今为止尚未解决的理论难题。被考虑在内。在这里,我们报告了在5.5至8.3 keV的光子能量下,飞秒X射线脉冲通过超强(约10 19 sup> W / cm 2 sup>)飞秒氙原子的多次电离的结果。并提出了能够在整个能量范围内再现实验数据的理论模型。我们的分析表明,共振和相对论效应的相互作用导致结构化的电荷状态分布,这反映了X射线脉冲期间产生的相对电荷移动的高电荷离子电子能级的共振位置。此处描述的理论方法为对具有高Z成分的目标进行硬X射线成像实验中的辐射损伤进行精确建模提供了基础。
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