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Band-broadening suppressed effect in long turned geometry channel and high-sensitive analysis of DNA sample by using floating electrokinetic supercharging on a microchip

机译:通过在微芯片上使用浮动电动增压在长转几何通道中实现了谱带展宽抑制作用并对DNA样品进行了高灵敏度分析

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摘要

A featured microchip owning three big reservoirs and long turned geometry channel was designed to improve the detection limit of DNA fragments by using floating electrokinetic supercharging (FEKS) method. The novel design matches the FEKS preconcentration needs of a large sample volume introduction with electrokinetic injection (EKI), as well as long duration of isotachophoresis (ITP) process to enrich low concentration sample. In the curved channel [∼45.6 mm long between port 1 (P1) and the intersection point of two channels], EKI and ITP were performed while the side port 3 (P3) was electrically floated. The turn-induced band broadening with or without ITP process was investigated by a computer simulation (using CFD-ACE+ software) when the analytes traveling through the U-shaped geometry. It was found that the channel curvature determined the extent of band broadening, however, which could be effectively eliminated by the way of ITP. After the ITP-stacked zones passed the intersection point from P1, they were rapidly destacked for separation and detection from ITP to zone electrophoresis by using leading ions from P3. The FEKS carried on the novel chip successfully contributed to higher sensitivities of DNA fragments in comparison with our previous results realized on either a single channel or a cross microchip. The analysis of low concentration 50 bp DNA step ladders (0.23 μg∕ml after 1500-fold diluted) was achieved with normal UV detection at 260 nm. The obtained limit of detections (LODs) were on average 100 times better than using conventional pinched injection, down to several ng∕ml for individual DNA fragment.
机译:设计了具有三个大储液槽和长转弯几何通道的特色微芯片,以使用浮动电动增压(FEKS)方法提高DNA片段的检测极限。新颖的设计满足了电动进样(EKI)引入大量样品的FEKS预浓缩要求,以及等速电泳(ITP)过程的持续时间长以富集低浓度样品的需求。在弯曲的通道中(端口1(P1)和两个通道的交点之间长约45.6 mm),在侧端口3(P3)电浮动时执行EKI和ITP。当分析物通过U形几何体时,通过计算机模拟(使用CFD-ACE +软件)研究了有无ITP工艺的转弯感应带展宽。已经发现,通道曲率决定了频带加宽的程度,但是可以通过ITP方法有效地消除它。在ITP堆叠的区域通过P1的交点后,将它们快速堆叠,以使用P3的前导离子从ITP到区域电泳进行分离和检测。与我们先前在单通道或交叉微芯片上获得的结果相比,在新型芯片上进行的FEKS成功地促进了DNA片段的更高灵敏度。低浓度50 bp DNA阶梯谱分析(稀释1500倍后为0.23μg/ ml)是通过在260 nm处进行常规UV检测实现的。所获得的检出限(LOD)平均比使用常规捏入法高100倍,单个DNA片段的检出限低至几ng / ml。

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