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Microwave Synthesized ZnO Nanorod Arrays for UV Sensors: A Seed Layer Annealing Temperature Study

机译:用于紫外线传感器的微波合成ZnO纳米棒阵列:种子层退火温度研究

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摘要

The present work reports the influence of zinc oxide (ZnO) seed layer annealing temperature on structural, optical and electrical properties of ZnO nanorod arrays, synthesized by hydrothermal method assisted by microwave radiation, to be used as UV sensors. The ZnO seed layer was produced using the spin-coating method and several annealing temperatures, ranging from 100 to 500 °C, have been tested. X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and spectrophotometry measurements have been used to investigate the structure, morphology, and optical properties variations of the produced ZnO nanorod arrays regarding the seed layer annealing temperatures employed. After the growth of ZnO nanorod arrays, the whole structure was tested as UV sensors, showing an increase in the sensitivity with the increase of seed layer annealing temperature. The UV sensor response of ZnO nanorod arrays produced with the seed layer annealed temperature of 500 °C was 50 times superior to the ones produced with a seed layer annealed at 100 °C.
机译:本工作报告了氧化锌(ZnO)种子层退火温度对ZnO纳米棒阵列的结构,光学和电学性质的影响,该纳米棒阵列是通过微波辐射辅助的水热法合成的,可用作紫外线传感器。 ZnO种子层是使用旋涂法生产的,并且已经测试了100至500°C范围内的几种退火温度。 X射线衍射(XRD),扫描电子显微镜(SEM),原子力显微镜(AFM)和分光光度法测量已用于研究所产生的ZnO纳米棒阵列关于晶种层退火温度的结构,形态和光学性质变化受雇。 ZnO纳米棒阵列生长后,将整个结构作为紫外线传感器进行测试,结果表明,随着种子层退火温度的提高,灵敏度也随之提高。种子层退火温度为500°C产生的ZnO纳米棒阵列的UV传感器响应比种子层退火温度为100°C产生的ZnO纳米棒阵列的UV传感器响应高50倍。

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