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Positron Annihilation and Complementary Studies of Copper Sandblasted with Alumina Particles at Different Pressures

机译:正压ni灭及不同压力下喷砂处理氧化铝颗粒的铜的补充研究

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摘要

Positron annihilation spectroscopy and complementary methods were used to detect changes induced by sandblasting of alumina particles at different pressures varying from 1 to 6 bar in pure well-annealed copper. The positron lifetime measurements revealed existence of dislocations and vacancy clusters in the adjoined surface layer. The presence of retained alumina particles in the copper at the depth below 50 µm was found in the SEM pictures and also in the annihilation line shape parameter profiles measured in the etching experiment. The profiles show us that the total depth of damaged zones induced by sandblasting of alumina particles ranges from 140 µm up to ca. 800 µm and it depends on the applied pressure. The work-hardening of the adjoined surface layer was found in the microhardness measurements at the cross-section of the sandblasted samples.
机译:使用正电子an没光谱法和补充方法来检测在经过良好退火的纯铜中,压力在1至6 bar之间变化的不同压力下,喷砂氧化铝颗粒引起的变化。正电子寿命测量表明,在邻接的表面层中存在位错和空位簇。在SEM照片中以及在蚀刻实验中测得的an灭线形状参数曲线中,发现了深度小于50 µm的铜中残留有氧化铝颗粒。剖面图表明,由喷砂氧化铝颗粒引起的损坏区域的总深度范围为140 µm到大约200 µm。 800 µm,取决于所施加的压力。在喷砂样品横截面的显微硬度测量中发现了邻接表面层的加工硬化。

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