硅漂移探测器用于X射线标识谱与吸收实验

摘要

利用硅漂移探测器测量不同元素的标识X射线，验证莫塞莱定律，计算屏蔽系数并解释其变化规律。利用不同厚度的镍吸收片做铜的标识X射线吸收，结果表明：单色化铜的标识X射线所需镍片的最佳厚度约为20μm 。%The characteristic X‐ray spectrum was measured using silicon drift detector ,the Mose‐ley law was verified ,and the shielding coefficient and its variation was calculated and explained .The absorption of the characteristic X‐ray spectrum of copper was investigated using nickel absorption sheets of different thickness .It was concluded that the optimum thickness of the nickel sheet required for the monochromatization of Cu characteristic spectrum was about 20 μm .