Micro-beam XRF localization by a laser beam

摘要

A new method for micro-beam XRF localiztion is presented.A laser beam along with an incident X-ray hits on the surface of a sample.The micro region on the sample that reached by X-ray beam can be localized by means of the visible spot of the laser beam.This method is suitable for X-ray microprobes using an X-ray tube or synchrotron radiation as excitation sources.