首页> 外文期刊>纳微快报:英文版 >Improving the Electrical Contact Property of Single-Walled Carbon Nanotube Arrays by Electrodeposition
【24h】

Improving the Electrical Contact Property of Single-Walled Carbon Nanotube Arrays by Electrodeposition

机译:通过电沉积改善单壁碳纳米管阵列的电接触性能

获取原文
获取原文并翻译 | 示例
       

摘要

A parallel method for the fabrication of metal contacts on single-walled carbon nanotube(SWNT)arrays was presented and the electrical contact property was evaluated by a SWNT-field effect transistor structure. Copper and gold contacts were fabricated on both semiconducting SWNTs and metallic SWNTs by using a maskless electrodeposition process. The SWNT array remained a p-type semiconductor after the electrodeposition. The contact resistance between SWNT array and microelectrodes was reduced more than 50% by the established copper contacts. The source-drain current of the carbon nanotube field-effect transistor(CNT-FET)structure can be further increased from 7.9 μA to 9.2 μA when the copper contacts were replaced by gold ones,which is probably due to the better contact property to SWNT of gold contacts with fine grain size.
机译:提出了一种在单壁碳纳米管(SWNT)阵列上制造金属触点的并行方法,并通过SWNT场效应晶体管结构评估了电接触性能。通过使用无掩模电沉积工艺,在半导体SWNT和金属SWNT上都制作了铜和金触点。电沉积后,SWNT阵列仍为p型半导体。通过建立的铜触点,SWNT阵列与微电极之间的接触电阻降低了50%以上。当用金触点代替铜触点时,碳纳米管场效应晶体管(CNT-FET)结构的源漏电流可以从7.9μA进一步增加到9.2μA,这可能是由于与SWNT的接触性能更好细粒度的金触点。

著录项

  • 来源
    《纳微快报:英文版》 |2013年第004期|P.242-246|共5页
  • 作者

    Min Zhang;

  • 作者单位

    Advanced Manufacturing Division, Graduate School at Shenzhen, Tsinghua University;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 CHI
  • 中图分类
  • 关键词

  • 入库时间 2022-08-19 04:06:22
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号