边界扫描技术的功能测试应用

摘要

随着芯片集成度的提高和表面贴装技术（SMT）的广泛使用,传统的针床在线测试已不再适合使用,而边界扫描技术在芯片级、板级、系统级测试得到广泛使用将是一种必然趋势。与传统边界扫描技术生成测试矢量进行结构化的静态测试不同,功能测试程序可采用高级语言开发,易于开发和维护。本文介绍了使用边界扫描技术对DDR模块进行动态的功能测试,该功能测试程序可快速准确测试出高速DDR模块数据线、地址线及存储单元是否能正常工作,并输出测试诊断信息。在此基础上,本文对该测试程序进行了改进。%With the higher level of IC integration and the widespread use of SMT,the traditional Bed-of-nails Testing Fixture is no longer suitable for testing.The boundary-scan technology will be an inevitable trend in the chip-level,board-level,and system-level tests.Unlike the traditional boundary-scan technology which generates test vectors for the structural static test,the functional test can be developed using high-level programming language,which is easy to develop and maintain.This paper describes the application of the boundary-scan technology in dynamic functional test for the DDR module.The test program can detect the malfunction of data lines,address lines and storage cells quickly and accurately.Furthermore,the testing program is improved in this paper.