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Target classification using SIFT sequence scale invariants

机译:使用SIFT序列比例不变的目标分类

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摘要

On the basis of scale invariant feature transform(SIFT) descriptors,a novel kind of local invariants based on SIFT sequence scale(SIFT-SS) is proposed and applied to target classification.First of all,the merits of using an SIFT algorithm for target classification are discussed.Secondly,the scales of SIFT descriptors are sorted by descending as SIFT-SS,which is sent to a support vector machine(SVM) with radial based function(RBF) kernel in order to train SVM classifier,which will be used for achieving target classification.Experimental results indicate that the SIFT-SS algorithm is efficient for target classification and can obtain a higher recognition rate than affine moment invariants(AMI) and multi-scale auto-convolution(MSA) in some complex situations,such as the situation with the existence of noises and occlusions.Moreover,the computational time of SIFT-SS is shorter than MSA and longer than AMI.

著录项

  • 来源
    《系统工程与电子技术(英文版)》 |2012年第5期|633-639|共7页
  • 作者单位

    Xi'an Institute of Optics and Precision Mechanics Chinese Academy of Sciences Xi'an 710119 P.R.China;

    Graduate University of Chinese Academy of Sciences Beijing 100049 P.R.China;

    Xi'an Institute of Optics and Precision Mechanics Chinese Academy of Sciences Xi'an 710119 P.R.China;

    Xi'an Institute of Optics and Precision Mechanics Chinese Academy of Sciences Xi'an 710119 P.R.China;

    Xi'an Institute of Optics and Precision Mechanics Chinese Academy of Sciences Xi'an 710119 P.R.China;

    Graduate University of Chinese Academy of Sciences Beijing 100049 P.R.China;

  • 收录信息 中国科学引文数据库(CSCD);
  • 原文格式 PDF
  • 正文语种 chi
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  • 入库时间 2022-08-19 04:47:29
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