一种新的码率兼容LDPC码打孔方案

摘要

该文研究码率兼容LDPC码的打孔问题.Ha等人研究LDPC码打孔时提出的Grouping和Sorting方案使低k-SR节点的数目最大化,它相对于随机打孔有了很大增益,但此方案只保证有一个存活校验节点.该文研究多个存活校验节点的作用,提出MSCN打孔方案最大化打孔节点的存活校验节点数.AWGN信道上的仿真结果显示,低码率时MSCN方案具有比Grouping和Sorting方案更为优越的性能.理论推导及实验结果均表明,码率兼容LDPC码打孔时,多个存活校验节点有益于译码性能的提升.%This paper considers the issue of finding good puncturing patterns for rate-compatible LDPC codes. When studying the puncturing of LDPC codes, Ha, et al. Obtain a so-called grouping and sorting puncturing scheme to maximize the number of lower k-SR nodes. Though the grouping and sorting scheme outperforms random puncturing schemes, it guarantees only single survived check node. This paper investigates the effect of multiple survived check nodes, and proposes an effective puncturing scheme called MSCN, which maximizes the number of survived check nodes. Simulation results over AWGN channels show that the proposed MSCN scheme is superior to the grouping and sorting scheme at low rates. By theoretical analysis and experimental results, it is indicated that multiple survived check nodes enhance the decoding performance of LDPC codes.