We introduce the relationship between excess noise in Optoelectronic Coupled Devices (OCDs) and their interior defectsand explain how low-fiequency noise can be used to estimate their reliability.Using concepts from the biological immunesystem and its process of identifying invaders,we present a system for estimation of the reliability of OCDs.The system hasexpressions for the antigen (excess noise),lymphocyte (criterion) and the role of the lymphocyte eliminating unreliable devices.A genetic algorithm was used to estimate the components parameters of the noise spectrum for estimating the reliability ofOCDs.The experimental results demonstrated that this method is reliable,adaptable and practical.
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