首页> 中文期刊>信息技术 >一种集成运放多参数自动测试的实验装置

一种集成运放多参数自动测试的实验装置

     

摘要

In order to develop a integrated operational amplifier multi-parameter automatic test laboratory equipment with comprehensive function and simple system to meet the needs of college experiment,the experimental device system was developed based on the control core micro-control unit (MCU) ARM TM4C128G,and the analog-to-digital converter DAC0832,and switch chip CD4066BE.The device can test the operational amplifier offset voltage,offset current,common mode rejection ratio,open-loop magnification and other parameters of the measurement automatically,the test results not only can be displayed by the liquid crystal display (LCD) device,but also can be output by voice broadcast.The results of verification test shows that the multi-parameter automatic test experiment device for integrated operational amplifier can realize automatically measure with accuracy result,user-friendly menu and simple operation.%为了开发一款功能全面而系统又不是太复杂的集成运放多参数自动测试实验装置,以满足面向高校的实验测试需求,以单片机ARM TM4C128G为控制核心、模数转换器DAC0832产生信号源、开关芯片CD4066BE为切换开关,利用液晶显示装置显示测试结果,同时还能实现语音播报输出的实验装置系统.该装置能完成运算放大器的失调电压,失调电流,共模抑制比,开环放大倍数等参数的测量,该装置经测试表明能准确的对集成运放的多参数进行自动测试,具有人性化菜单设计,使用方便.

著录项

相似文献

  • 中文文献
  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号