在半导体技术高速发展的今天，对集成电路的测试要求越来越高，测试开发的难度、复杂度都在增加，如何应对当前集成电路的测试需求，成为测试开发者需要考虑的问题。Ultra-FLEX测试系统是新一代的测试系统，用以应对当今的测试需求。文章介绍了Ultra-FLEX测试系统的硬件资源，列举了部分模块及其功能和参数；描述了一般集成电路测试开发的流程，并以数字集成电路为例介绍了相关测试内容；介绍了Ultra-FLEX测试系统的软件环境，列举了测试程序构成要素以及各自功能；介绍了Ultra-FLEX测试系统的程序调试环境，测试系统提供的调试工具以及调试方法。%Today, as the semiconductor technology is developing very fast, it requires high level testing, testing development becomes more difficult, more complex, how to satisfy the testing requirement is a question which testing developer need to think. Ultra-FLEX is a new generation test system which is used to test current integrated circuit. This article introduce the hardware of Ultra-FLEX, list some of the options and their function and parameter;describe the general procedure of testing development, and introduce the testing items of digital IC as example;introduce the software environment of Ultra-FLEX, list the content of a testing program and their function;introduce the debugging environment of Ultra-FLEX, the debugging tools provided by the system, and the debugging method.
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