PAE is one of the key parameters of power amplifier, and has a variety of related testing technology. The paper discusses several common methods for measuring PAE of power amplifier. The advantages and disadvantages of these methods are analyzed, and a new method for measuring the PAE of the power amplifier is proposed, based on the PNA-X. In this way, the S-parameters, power parameters and PAE are tested in 15 seconds, scan 250 points with one connected. The error of the test results is not more than 2%, The test method can be applied to the typical application of the power amplifier test on wafer.%效率是功率放大器的关键参数之一,有着多种成熟的相关测试技术。讨论了几种常见功率放大器效率测试的方法,针对脉冲功率放大器在片生产应用测试技术要求,分析了各测试方法的优缺点,并在综合各测试方法的基础上引出一种新的功率放大器效率测试方法。提出基于PNA-X的脉冲放大器效率快速测试方法,实现脉冲放大器效率的快速测试,实现单次连接测试放大器的S参数、功率参数和效率,实现250个频点的扫描测试耗时不超过15 s,测试结果经过典型器件验证,其测试结果误差不超过2%,该测试方法可适用于功率放大器的在片测试典型应用。
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