AT89系列单片机的测试技术磁

摘要

单片机是系统设计中的关键器件。由于集成度高，功能复杂，如何简单全面的实现各部分功能测试是测试中的难点。论文以 AT89C55单片机为例，针对单片机的特点和应用，提出设计搭建最小系统方法，实现“学习法”获取测试图形向量，从而实现单片机的测试。%MCU is a key device in system design .How to achieve all parts of its function test simply and comprehen‐sively is the difficulty in the test ,because of its high integration and complex functional .Taking AT89C55 MCU for exam‐ple ,this article introduces the significant features and application ,puts forward a design of MCU minimum testing system , obtains the test pattern by “learning method” and achieves the test of MCU in detail .