双端口静态存储器测试方法研究磁

摘要

As the development of information and digital technology ,dual port static random access memory is widely applied in high speed multi‐processor systems .The complication and test time of memory test is increased by its high per‐formance .It is significant to research on test methods of dual port SRAM for reducing the complication and test time with test coverage rate guaranteed .In this paper ,the structure and function is analyzed and the failure mode of read and write function and arbitration control module function is researched .A test method design of simultaneity testing is proposed and achieved on V93000 testing system .It can reduce the length of the test pattern and increase the test efficiency .%随着信息化和数字化技术的发展，双端口静态存储器在高速多处理器系统中广泛应用。其具有的高性能提高了存储器测试的复杂度，增加了测试时间。在保证测试覆盖率的情况下降低测试复杂度和测试时间是双端口静态存储器测试的关键。论文分析了双端口静态存储器的结构和功能，研究了双端口静态存储器的读写功能失效模式和仲裁控制模块功能失效模式，并提出了一种“同测”方法的测试算法设计，给出了基于 V93000测试系统的实现方法，有效地减少了测试向量操作长度，提高了测试效率。